Lab systems for NDT with active thermography

With lock-in and pulse thermography, hidden defects on components made of all manner of materials can be detected in a non-destructive manner without contact.

Lock-in and pulse thermography methods are based on the generation of a defined heat flow in the component to be inspected. The resultant temperature across the surface of the component is determined by means of a sensitive infrared camera and generated as a sequence of images. Through suitable signal analysis across the image sequence, it is possible to obtain an image of the inner component structure and to identify any defects. To put it simply, the process is known as “thermal x-raying”.

Picture: Principle of non-destructive testing with active thermography

Ndt (non-destructive testing) with pulse and lock-in thermography

Where the heat flow is generated by pulsed stimulation, this is pulse thermography. This process is particularly beneficial in the case of good thermal conductors. In the case of LockIn thermography, on the other hand, stimulation is provided in the form of a harmonic function. The wide range of excitation sources available from Automation Technology ensures we can best adapt the systems to suit the particular task:

  • Halogen lamps and radiator panels
  • Hot-air blowers
  • Digital ultrasound generators
  • High-power flash generators
  • Eddy current generators
  • Microwave radiators

Automation Technology offers innovative all-in-one systems for these testing procedures, complete with the latest accessories. Thanks to their modular design, the systems guarantee maximum flexibility and reliability.